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Creators/Authors contains: "Hsu, S.-H."

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  1. ; ; ; ; ; ( , Microelectronics reliability)
    null (Ed.)
    To accurately determine the reliability of SRAMs, we propose a method to estimate the wearout parameters of FEOL TDDB using on-line data collected during operations. Errors in estimating lifetime model parameters are determined as a function of time, which are based on the available failure sample size. Systematic errors are also computed due to uncertainty in estimation of temperature and supply voltage during operations, as well as uncertainty in process parameters and use conditions. 
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    Full Text Available 
  2. ; ; ( , Design of Circuits and Integrated Systems)
    Accelerated lifetime tests are necessary for reliability evaluation of circuits and systems, but the parameters for choosing the test conditions are often unknown. Furthermore, reliability testing is generally performed on test structures that have different properties than actual circuits and systems, which may create inconsistencies in how circuits and systems work in reality. To combat this problem, we use ring oscillators, which are similar to circuits, based on the 14nm FinFET node as the circuit vehicle to extract wearout data. We explore the effects of testing time, sample size, and number of stages on the ability to detect failures for various test conditions, focusing on front-end time dependent dielectric breakdown, which is one of the most dominant wearout mechanisms. 
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  3. ( , IEEE International Symposium on On-Line Testing and Robust System Design)
    Circuits may fail in the field due to a wide variety of failure modes. If there are frequent failures in the field, circuits are returned to the manufacturer, and the causes of failure must be identified. The challenge is that wearout mechanisms are confounded in circuit and system-level failure data. Using such failure data, it is often hard to separate the underlying failure causes without time-consuming and expensive physical failure analysis. To distinguish the wearout mechanisms for each failure sample, we have developed a quick and low-cost methodology using maximum likelihood estimation and probability analysis to determine the origin of the failure distributions, region of error, and sorting accuracy. We apply our methodology to analyze the competing wearout mechanisms in 14nm FinFET ring oscillators, as an example, using simulation. We also consider the problem of Trojan detection. 
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    Accepted Manuscript Full Text Available
  4. ; ; ; ; ( , International IEEE/EMBS Conference on Neural Engineering)
    Electroencephalography (EEG)-based emotion classification has drawn increasing attention yet EEG signals associated with emotional responses are still elusive. This study applies a multi-model adaptive mixture independent component analysis (AMICA) as an unsupervised approach to identify and characterize emotional states. Empirical results showed that the AMICA was able to learn distinct models that accounted for four self-imagery emotions. While large-scale analyses and careful examinations are needed, the pilot study offers evidence for AMICA as a promising, data-driven approach to model EEG dynamics of self-imagery emotions. 
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    Accepted Manuscript Full Text Available